Hi, I designed my own set of TRL calibration standards on a multilayer ceramic substrate (LTCC). Measurements were performed using Cascade Microtech wafer...
Dear Tero, NIST does offer Reference Material (RM) 8130. You can visit http://www.boulder.nist.gov/div813/rfelec/micro/dylan/cpw_srm.html to find out more...
Hello, Excuse me my ignorance! I need some clarity about reference plane for on-wafer calibration & measurement using VNA and probe Station. Can you please...
Dear Felix, The reference plane for a TRL calibration starts in the center of the thru line. However, it can then be moved mathematically with the propagation ...
Dear Dylan, Thank You very much for the explanations. It makes more sense to me now. I would look at the MultiCal manual. Best regards, Felix ... From: Dylan...
Dear All, I have a question concerning accuracy of determining effective dielectric constant (EDK) from thru-reflect-line (TRL) calibration. EDK is one of...
... This is a very interesting and difficult question, to which I do not have a good answer. But here are some ideas. The first thing to consider is that the...
Dear Dylan, Thank you very much for your reply. ... Perhaps I should have expressed my question more clearly. In the first calibration example I noticed an...
Dear Marek, I am sorry, but I did misunderstand your question. The small drop at the first frequency point could indeed be measurement error. Typically our ...
Dear Dr Williams,
I'm having problems running a very simple single line TRL cal with Statistical.
My data is from WR90 waveguide from 8.2 - 12.4GHz with...
Dear Dr. Dylan, I am trying to do TRL calibration on CPW lines on silicon substrate. I am not getting good results. I see spikes in the measurements. Here is...
Dear Imad, There are a few MultiCal "tricks" you might find useful. Have you tried the debug option (you can turn this on with the "d" key)? You can use this...
Dear Dr. Dylan, Thank you for your help. I tried your suggestions but they did not work. The spikes I am seeing are few db in magnitude. I could not enter the...
Hi everyone! I have a question concerning on-wafer transistor measurements. I have noticed that I get two kind of results when I'm measuring the probe-station...
Dear Dr. Dylan, Thank you for your help. I am attaching all MultiCal files for your review. Please let me know what am doing wrong. Thanks, Imad Dylan Williams...
Dear Imad, You seem to have taken some very nice data. However, it appears to me that your guess for the effective dielectric constant may not have been very ...
Dear Dr. Dylan, Thank you for your help. I entered 4.0 for the effective dielectric constant and the data looks very smooth. All the spikes are gone. I could...
Hi, I am new on 'TRL calibration'. I followed Agilent's notes and some papers to design my layout. I calibrated using 2-line TRL then measured some spiral...
Dear Ming- Both MultiCal and StatistiCAL are designed to solve your problem. They will accept multiple measurements of different transmission lines and give...
Dear Dylan, Thanks for your message. Currently I am reading MultiCal menu and try to install to my PC. I assume it can run alone on PC (without connecting to...
Hi, Is any one running MultiCal on XP? Should I use HTBasic 5.2 from this yahoo group's file download, or HTBasic 9.0 from www.transera.com? Thanks for your...
Dear, Related to the question below: could someone recommend us which layout changes to the MOSFET and/or which additional dummy structures would be necessary...
Hi- I have not used HTBasic 9.0, but I imagine that both should work on XP. I tried HTBasic 5.2 and it worked on my XP machine. Dylan ... Dylan Williams...
Dear Dominique, Again, I cannot give you a complete answer to this question. The basic problem is that you may have up to four conductors in this system, as...
Hi Dominique, One particular FR4 material has the following parameters: er=4.75, tan d=0.0135 (probably at 1 GHz). This is the type of material that would be...
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